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Atomic Force Microscopes (AFM) provide unprecidented spatial resolution and the ability to probe the local electrical, magnetic, mechanical properties. In our laboratory we are carrying out measurements of in-plane deformation in situ under an AFM. High-resolution AFM images of specimen surface, subjected to macroscale stress, are processed with Digital Image Correlation (DIC) to resolve local fields. We develop mechanical testing stages to apply load to thin film and macroscale specimens while imaging with an AFM to study mechanical deformation in polycrystallin materials at differnt length scales, Figure (a), apply inverse solutions utilizing 2D full-field deformation measurements to extract mechanical properties from non-uniform specim geometries, Figure (b), or study incremental crack grown in heterogeneous materials, Figure (c). Of special interest is the study of local deformation in heterogeneous materials such as nanocomposites.

(a)

(b)

(c)

                                                                                                    Related Publications

1. O.E. Moronkeji, D. Das, S. Lee, K.M. Chang, and I. Chasiotis, "Local electrical conductivity of carbon black/PDMS nanocomposites subjected to large deformations." Journal of Composite Materials 57 (4), pp. 507-519, (2023).

2. X. Li, I. Chasiotis, T. Kitamura, “In situ Scanning Probe Microscopy Nanomechanical Testing”, MRS Bulletin 35 (5), pp. 361-367, (2010).

3. Q. Chen, I. Chasiotis, C. Chen, and A. Roy, “Nanoscale and Effective Mechanical Behavior and Fracture of Silica Nanocomposites,” Composites Science and Technology 68, pp. 3137-3144, (2008).

4. S.W. Cho, K. Jonnalagadda, and I. Chasiotis, (Invited) "Mode I and Mixed Mode Fracture of Polysilicon for MEMS," Fatigue and Fracture of Engineering Materials and Structures 30, pp. 21-31, (2007).

5. S.W. Cho and I. Chasiotis, "Elastic Properties and Representative Volume Element of Polycrystalline Silicon for MEMS," Experimental Mechanics 47 (1), pp. 37-49, (2007).

6. I. Chasiotis, S.W. Cho, K. Jonnalagadda, "Fracture Toughness and Crack Growth in Polycrystalline Silicon", Journal of Applied Mechanics 73 (5) , pp. 714-722, (2006).

7. S..W. Cho and I. Chasiotis, T.A. Friedman, and J. Sullivan, "Direct Measurements of Young’s Modulus, Poisson Ratio and Failure Properties of ta-C MEMS," Journal of Micromechanics and Microengineering 15, pp. 728-735, (2005).

8. . Cho, J.F. Cardenas-Garcia, and I. Chasiotis, "Measurement of Nano-displacements and Elastic Properties of MEMS via the Microscopic Hole Method," Sensors and Actuators A Physical 120, pp. 163-171, (2005).

9. . Chasiotis, Invited Paper: "Mechanics of Thin Films and Microdevices", IEEE Transactions of Devices, Materials, and Reliability 4 (2), pp. 176-188, (2004).

10. I. Chasiotis, H.L. Fillmore, and G.T. Gillies, "AFM measurement of cytostructural elements involved in the nanodynamics of tumor cell invasion", Nanotechnology 14 (5), pp. 557-561, (2003).

11. H.L. Fillmore, I. Chasiotis, S.W. Cho, and G.T. Gillies, "AFM Observations of Tumor Cell Invadopodia: Novel Cellular Nanomorphologies on Collagen Substrates", Nanotechnology 14 (1), pp. 73-76, (2003).

12. W.G. Knauss, I. Chasiotis, Y. Huang, "Mechanical Measurements at the Micron and Nanometer Scales", Mechanics of Materials 35 (3-6), pp. 217-231, (2003).

13. I. Chasiotis, W.G. Knauss, "A New Microtensile Tester for the Study of MEMS Materials with the aid of Atomic Force Microscopy", Experimental Mechanics 42 (1), pp. 51-57, (2002).